Knowledge-based test generation
作者:
M.J.Schofield,
期刊:
IEE Proceedings G (Electronic Circuits and Systems)
(IET Available online 1985)
卷期:
Volume 132,
issue 3
页码: 108-110
年代: 1985
DOI:10.1049/ip-g-1.1985.0023
出版商: IEE
数据来源: IET
摘要:
One view of what constitutes a testable circuit design is that sufficient circuit knowledge exists to allow an effective test program to be generated. HITEST is a test-generation system based on the definition, capture and use of knowledge items about the elements and overall behaviour of the circuit. The paper describes the general form of the knowledge items and indicates how the system makes use of and is constrained by the knowledge.
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