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Low−cost apparatus for the determination of the refractive index of thin dielectric films

 

作者: James J. Brady,   Adolph L. Lewis,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1975）
卷期: Volume 46, issue 1  

页码: 48-49

 

ISSN:0034-6748

 

年代: 1975

 

DOI:10.1063/1.1134050

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A relatively simple apparatus for determining the index of refraction of substrates such as ZnSe and the index of refraction of thin films deposited on a substrate is described. Use is made of a readily available Lansing mirror mount and two Lansing translational stages.

 

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