Lattice parameter determination using Kikuchi‐line intersections: application to olivine and feldspar
作者:
A. Olsen,
期刊:
Journal of Applied Crystallography
(WILEY Available online 1976)
卷期:
Volume 9,
issue 1
页码: 9-13
ISSN:1600-5767
年代: 1976
DOI:10.1107/S0021889876010406
出版商: International Union of Crystallography
数据来源: WILEY
摘要:
The method of determining the ratio between lattice parameter and electron wavelength from Kikuchi‐line intersections with an accuracy about 0.1% which was described by Høier [Acta Cryst. (1969). A25, 516–518] for cubic crystals, is extended to crystals with any lower symmetry. A computer program using a least‐squares refinement has been developed and applied to the determination of unknown lattice parameters in an orthorhombic olivine and a triclinic feldspar crystal. A combination of energy‐dispersive X‐ray analysis and Kikuchi‐line intersection measurements can in many cases be utilized to increase the accuracy in the determination of the lattice parameters. For the feldspars such a combination of measurements can be used to determine the distribution of the Al and Si atoms in the tetrahedral positions of t
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